On Aging Of Key Transistor Device Parameters
نویسندگان
چکیده
Alec Feinberg is senior principal reliability engineer at M/A-COM. He received his Ph.D. in Physics from Northeastern University. He has 17 years of reliability physics experience. He previously worked at TASC and AT&T Bell Laboratories. Dr. Feinberg has actively published in the area of reliability physics since 1986 and at the IEST on a wide variety of topics from accelerated reliability growth modeling, parametric reliability analysis of various components, aircraft corrosion analysis, mechanical creep modeling, crystal and SAW filter aging, and thermodynamic reliability theory. He is a principal author and editor of Design for Reliability published by Penton.
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